Data processing: generic control systems or specific application – Specific application – apparatus or process – Mechanical control system
Reexamination Certificate
2001-05-04
2004-04-20
Picard, Leo (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Mechanical control system
C700S046000, C700S275000, C137S015110, C361S063000, C702S051000, C702S058000
Reexamination Certificate
active
06725130
ABSTRACT:
STATEMENT OF GOVERNMENT INTEREST
The invention described herein may be manufactured and used by or for the Government of the United States of America for governmental purposes without the payment of any royalties thereon or therefor.
BACKGROUND OF THE INVENTION
The present invention relates to fluid-mechanical and other electro-mechanical systems, more particularly to methods and apparatuses for ascertaining or assessing defects in such systems.
A pressurized fluid delivery system is a type of electro-mechanical delivery system. Pressurized fluid delivery systems normally include a pump (for water or other liquid) or compressor (for air or other gas), a conduit configured in plural sections, plural pressure switches and plural valves. Typically, when the system “springs a leak,” several pressure switches react to the drop in pressure, with the result that the entire system automatically shuts down. This total system shutdown is frequently an unnecessary and unwanted consequence of a single leak.
More generally, it is frequently undesirable for an electro-mechanical delivery system of any kind to unnecessarily shut down as a consequence of a single fault or defect, especially if such system can continue to operate in near-optimal fashion in spite of such fault or defect.
SUMMARY OF THE INVENTION
In view of the foregoing, it is an object of the present invention to provide method, apparatus and software for pinpointing a fault or defect in an electro-mechanical delivery system such as a pressurized fluid delivery system.
It is a further object of the present invention to provide such method, apparatus and software so that such system can avoid shutdown.
It is another object of the present invention to provide such method, apparatus and software so that such system can continue to operate, substantially as it had before the occurrence of the fault or defect, in circumventive fashion with respect to the fault or defect.
In accordance with many embodiments of the present invention, a processor-controller is associated with at least one combination (more typically, each combination) of a valve/switch and dual sensors, such combination being included in an electro-mechanical distribution system. The processor-controller processes information received from the sensors and controls the open-versus-closed actuation of the valve/switch. According to the inventive control logic, the valve/switch-sensor combination is either in normal mode or fault (defect) mode. When a fault condition of either sensor is detected, the processor-controller converts from normal mode to fault mode. A “transient waiting” period takes place at the outset of the fault mode. Then, the control logic may either continue in fault mode by proceeding through a sequence of steps, or return to normal mode. In each step, a “step waiting period” (during which time the valve is closed) may be followed by a “step testing period” (during which time the valve is closed). While in normal mode, if at any time either sensor detects a fault condition, the control logic goes to fault mode; otherwise, the control logic remains in normal mode. While in fault mode, if at any time both sensors concurrently detect a normal condition, the control logic returns to normal mode; otherwise, the control logic remains in fault mode. When the inventive stepped control logic sequence is complete, the inventive practitioner realizes that the suspected fault associated with a given such combination is most likely real.
Many embodiments of the present invention provide apparatus for use in association with an electro-mechanical distribution system characterized by at least one branch, an entity (e.g., fluid or electrical current) for being distributed by said electro-mechanical distribution system to some degree by way of said at least one branch, at least one source of said entity, and at least one station for affecting distribution of said entity. The at least one station is in communication with the at least one branch. Each station includes switching means and a pair of sensing means on both sides of the switching means. The inventive apparatus is for isolating at least one fault condition within the electro-mechanical distribution system. The inventive apparatus comprises at least one machine having a memory. Each machine: is connected with a station; receives input from the corresponding pair of sensing means; effectuates control with respect to the corresponding switching means; contains a data representation of a stepped control logic scheme which defines the effectuating of control and which relates to the corresponding pair of sensing means and the corresponding switching means. The stepped control logic scheme includes a normal mode and a fault mode, wherein the indication of a fault condition by at least one of the corresponding pair of said sensing means at any time during said normal mode results in a change from said normal mode to said fault mode, and wherein the simultaneity of indication of a normal condition by both of the corresponding pair of said sensing means at any time during said fault mode results in a change from said fault mode to said normal mode.
Typically according to such inventive apparatus embodiments, the fault mode includes at least one step. Each step includes a pre-test waiting period and a testing period which follows the pre-test waiting period. During the pre-test waiting period the switching means is in a closed condition. During the testing period the switching means is in an open condition. If it does not occur at any time during the pre-test waiting period that both of the corresponding pair of sensing means simultaneously indicate a normal condition, the switching means is rendered in an open condition at the conclusion of the pre-test waiting period, wherupon the testing period commences. If it does not occur at any time during the testing period that both of the corresponding pair of sensing means simultaneously indicate a normal condition, the switching means is rendered in a closed condition at the conclusion of the testing period. If it occurs at any time during the pre-test waiting period that both of the corresponding pair of sensing means simultaneously indicate a normal condition, the switching means is rendered in an open condition at the conclusion of the pre-test waiting period, wherupon the normal mode resumes. If it occurs at any time during the testing period that both of the corresponding pair of sensing means simultaneously indicate a normal condition, the switching means remains in an open condition at the conclusion of the testing period, whereupon the normal mode resumes.
Also typical according to such inventive apparatus embodiments, the fault mode includes a transient test waiting period which precedes the first step. If both of the corresponding pair of sensing means simultaneously indicate a fault condition, the transient test waiting period commences. During the transient test waiting period the switching means remains in an open condition. If it does not occur at any time during the transient test waiting period that both of the corresponding pair of said sensing means simultaneously indicate a normal condition, the switching means is rendered in a closed condition at the conclusion of the transient test waiting period, whereupon the first pre-test waiting period commences.
Further typical according to such inventive apparatus embodiments, there are at least two sequential steps. Each sequential step except the last sequential step is followed by a pre-test waiting period of the succeeding sequential step. Beginning the second sequential step, each pre-test waiting period is longer than the preceding pre-test waiting period. Beginning the second sequential step, each testing period is shorter than the preceding testing period. According to many such inventive apparatus embodiments, the duration of the transient test waiting period, the durations of the pre-test waiting periods, and the durations of the testing periods, are based on the following inventive principles: The am
Rogers John L.
Zerby Mark M.
Kaiser Howard
Ortiz Carlos R.
Picard Leo
The United States of America as represented by the Secretary of
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