Scanning tip microwave near field microscope

Details Scanning tip microwave near field microscope Scanning tip microwave near field microscope

1996-09-20

1998-10-13

Larkin, Daniel S.

Measuring and testing

Surface and cutting edge testing

Roughness

250306, 250307, H01J 3720, G01B 734

Patent

active

058214100

ABSTRACT:
A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

REFERENCES:
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