Probe card

Details Probe card Probe card

2001-02-20

2002-10-08

Sherry, Michael (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

06462569

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to a probe card and, more particularly, to an improved electrode structure on a circuit board. By means of novel arrangement of the present invention, wiring can be accomplished in duplicate manner, layout and debugging can be easily performed, and working efficiency can be enhanced.
BACKGROUND OF THE INVENTION
In the prior art, a probe card is provided on a detection head of a specially designed IC tester for testing a chip. The structure of the probe card is shown in
FIGS. 1 and 2
, wherein a plurality of circularly arranged electrodes
2
a
are provided on a circuit board
1
a
. The electrodes
2
a
are respectively connected to one ends of thin probes
3
a
made of gold wires. The other ends of the probes
3
a
are floating and can be used to detect pads
6
a
of a chip
5
a
on a wafer
4
a
so as to input signals to the chip
5
a
or detect output values from the chip
5
a
. By controlling an electron microscope and a machine arm, all chips
5
a
on the same wafer
4
a
can be tested one by one.
However, the following problems are often generated when connecting the probes
3
a:
1. Wire cutting or jumping is often required to manufacture sequential wiring (shown in FIG.
3
).
2. Wrong soldering after wire jumping usually occurs so as to increase the production time and cost.
3. Electrical characteristics cannot be exactly followed so that the difficulty of duplication is increased.
4. Debugging time is increased.
5. It is hard to perform on-line maintenance.
SUMMARY OF THE INVENTION
To resolve the above problems in the prior art, the primary object of the present invention is to change the arrangement manner of the electrodes from circular arrangement to parallel arrangement so as to avoid complicated wiring. Thereby, it is easy to connect the probes, and the manufacturing efficiency can be greatly enhanced.
To achieve the above object, the present invention provides a probe card comprising a circuit board, a plurality of electrodes, and a plurality of probes. The electrodes are provided on the circuit board and are parallel arranged. One ends of the probes are respectively connected to the electrodes, and the other ends thereof are floating and can be used to test chips.
The various objects and advantages of the present invention will be more readily understood from the following detailed description when read in conjunction with the appended drawings, in which:


REFERENCES:
patent: 4799009 (1989-01-01), Tada et al.
patent: 5177439 (1993-01-01), Liu et al.
patent: 5491427 (1996-02-01), Ueno et al.
patent: 5670889 (1997-09-01), Okubo et al.
patent: 6100708 (2000-08-01), Mizuta
patent: 6121784 (2000-09-01), Montoya

Affiliated with

Also associated with

Rating

Probe card does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe card, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2998773