Patent
1979-04-24
1981-05-05
Larkins, William D.
357 28, 357 36, 357 51, 357 86, H01L 2972
Patent
active
042662362
ABSTRACT:
A technique of increasing the safe operating area of a power transistor is disclosed which comprises the addition of a resistive region of a conductivity (P or N) opposite that of the emitter conductivity, the resistive region located between the emitter region and the emitter electrode so as to prevent local thermal runaway of the emitter current and the concomitant secondary breakdown of the transistor. A conducting electrode connects the emitter region to the resistive region to thereby short-circuit the resistive-emitter region junction.
REFERENCES:
patent: 3358197 (1967-12-01), Scarlett
patent: 3519898 (1970-07-01), Natani
patent: 3619741 (1971-11-01), Morgan et al.
patent: 3740621 (1973-06-01), Carley
patent: 3769561 (1973-10-01), White et al.
patent: 3801886 (1974-04-01), Imaizumi et al.
patent: 3858234 (1974-12-01), Olson
patent: 3893154 (1975-07-01), Mroczek et al.
patent: 3918080 (1975-11-01), Kerr
patent: 3936863 (1976-02-01), Olmstead
Larkins William D.
Nippon Electric Co. Ltd.
LandOfFree
Transistor having emitter resistors for stabilization at high po does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Transistor having emitter resistors for stabilization at high po, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transistor having emitter resistors for stabilization at high po will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-298465