Micromanipulator

Details Micromanipulator Micromanipulator

1999-02-12

2002-06-25

Robinson, Mark A. (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C359S368000

Reexamination Certificate

active

06411433

ABSTRACT:

BACKGROUND OF THE INVENTION
The present invention relates to a micromanipulator for microscopically manipulating an infinitesimal sample, for example.
Conventionally known is a micromanipulator
4
(hereinafter referred to as a first prior art) that is incorporated in a microscope system
2
, as shown in
FIG. 11
, for example.
The first prior art micromanipulator
4
comprises a rod- or needle-shaped manipulation probe
6
and a transfer control device
8
, which can move the probe
6
in a given direction and locate it in a given position. The manipulation probe
6
is supported on the control device
8
by means of a mounting holder
10
. The micromanipulator
4
is attached to a microscope body
14
by means of a manipulator fixing member
12
.
According to this micromanipulator
4
, the manipulation probe
6
is operated for a sample (e.g., cell, fertilized edge, etc.)
20
in a vessel
18
that is placed on a microscope stage
16
. By doing this, the sample
20
is situated in the view range of an objective lens
22
, or the sample
20
in the view range of the lens
22
is reoriented.
Supposedly, the manipulation probe
6
of the first prior art may be positioned with respect to the sample
20
that adheres to the inside of a transparent frame
24
, as shown in
FIG. 12
, for example, or the probe
6
may be inserted into the view range of the high-magnification objective lens
22
whose working distance is short. Usually, therefore, the distal end of the manipulation probe
6
is sharp and elongated so that the probe
6
can be inserted securely and smoothly into the narrow working space.
Illumination light from a condenser lens
28
opposed to a transparent plate
26
that constitutes the frame
24
, for example, is applied to the sample
20
and the manipulation probe
6
in the working space with the probe
6
in the frame
24
. By doing this, the sample
20
and the manipulation probe
6
can be observed microscopically as the sample
20
is manipulated by means of the probe
6
.
Described in Jpn. Pat. Appln. KOKOKU Publication No. 57-53925, moreover, is a micromanipulator
4
(hereinafter referred to as a second prior art) that is incorporated integrally in a condenser lens
28
, as shown in
FIG. 13
, for example.
The second prior art micromanipulator
4
comprises a manipulation probe
6
, which is passed through holes
30
in the condenser lens
28
and can move up and down in the direction of the arrow in
FIG. 13
along the optical axis of the objective lens
22
.
According to this micromanipulator
4
, the manipulation probe
6
itself or the condenser lens
28
is moved up and down to subject the sample
20
in the vessel
18
on the microscope stage
16
to a predetermined manipulation process.
Since the elongated manipulation probe
6
having a sharp distal end is used in the first prior art, however, the following problems will arise if the stiffness of the probe
6
is lowered. For example, the manipulating capability may lessen due to interaction between the manipulation probe
6
and the sample
20
, and the positioning accuracy may lower as the deflection of the probe
6
increases. If the probe
6
moves suddenly as it is subjected to accumulation and release of elastic strain energy, moreover, the probe
6
and the sample
20
may be destroyed, or the sample
20
may get out of the view range of the objective lens
22
.
Since the condenser lens
28
having the holes
30
bored therein is used in the second prior art, on the other hand, a boring process for the lens
28
is required additionally, and besides, the presence of the holes
30
in the lens
28
has a bad influence upon the effect of screening from the optical system or the like. Further, a position adjusting mechanism (not shown) for the condenser lens
28
is utilized in moving the manipulation probe
6
of the micromanipulator
4
within the view range. In order to maintain good adjustment of illumination light, however, it is not adjustment of illumination light, however, it is not advisable to change the position of the condenser lens
28
. In the case where the lens
28
is fixed in a satisfactory adjustment position, furthermore, it should be bored with relatively large holes
30
to allow the manipulation probe
6
to move therein. However, enlarging the holes
30
exerts an additional bad influence upon the effect of screening from the optical system or the like.
BRIEF SUMMARY OF THE INVENTION
The object of the present invention is to provide a micromanipulator having a high-stiffness manipulation probe capable of carrying out a manipulation process in the view range of a microscope without modifying an existing observation optical system.
In order to achieve the above object, a micromanipulator according to the present invention for manipulating a sample in the view range of a microscope, comprises a high-stiffness manipulation probe and a probe supporting member supporting and operating the manipulation probe.
Additional objects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objects and advantages of the invention may be realized and obtained by means of the instrumentalities and combinations particularly pointed out hereinafter.


REFERENCES:
patent: 4270838 (1981-06-01), Furusawa et al.
patent: 5540958 (1996-07-01), Bothra et al.
patent: 5702822 (1997-12-01), Terui et al.
patent: 5753911 (1998-05-01), Yasuda et al.
patent: 6013573 (2000-01-01), Yagi
patent: 57-53925 (1982-11-01), None

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