Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2000-08-04
2002-06-11
Mehta, Bhavesh (Department: 2621)
Image analysis
Applications
Manufacturing or product inspection
C348S087000, C382S152000
Reexamination Certificate
active
06404912
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates, in general, to visual inspection of an object and, more particularly, to an apparatus and a process for visually inspecting an object.
Typically, work pieces such as semiconductor devices are visually inspected to insure that they meet design specifications for parameters such as lead coplanarity, lead length, lead straightness, mark inspection, surface inspection, lead pitch, etc. The visual inspection of a semiconductor device is conventionally performed using a visual inspection station. The semiconductor device is placed on the visual inspection station. Using either a front lighting technique or a back lighting technique, the images of the semiconductor device are formed and analyzed using a vision computer. If the semiconductor device meets predetermined design specifications, the device passes the inspection and is moved to the next stage of the manufacturing process. Otherwise, the device is rejected. The conventional visual inspection process disrupts the process of handling the semiconductor device and is often time consuming. Further, it is difficult to incorporate the conventional visual inspection process in an automated device handling process that is both cost efficient and time efficient.
Accordingly, it would be advantageous to have an apparatus and a method for visually inspecting an object in an automated process of handling the object. It is desirable for the method to be simple and time efficient. It is also desirable for the apparatus to be inexpensive. It would be of further advantage for the apparatus to be compatible with existing object handling equipment and process.
REFERENCES:
patent: 4750035 (1988-06-01), Chang et al.
patent: 5214841 (1993-06-01), Howard et al.
patent: 5402505 (1995-03-01), Roy et al.
patent: 5519513 (1996-05-01), Copenhaver et al.
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5699447 (1997-12-01), Alumot et al.
patent: 6160906 (2000-12-01), Lehnen et al.
LeBeau Christopher John
Lehnen David Charles
Twine Tonya Marie
Fink Mark J.
Martinez Anthony M.
Mehta Bhavesh
Motorola Inc.
LandOfFree
Method and apparatus for visually inspecting an object does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for visually inspecting an object, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for visually inspecting an object will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2904398