Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Patent
1991-05-06
1995-02-14
Snow, Walter E.
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
324262, G01N 2782, G01R 3312
Patent
active
053898761
ABSTRACT:
An eddy current probe array is disclosed comprising a plurality of spatially correlated eddy current probe elements sufficiently disposed within a flexible interconnecting structure to collect a discrete plurality of spatially correlated eddy current measurements for nondestructive near surface flaw detection. A plurality of precisely fabricated, substantially identical elements being sufficiently distributed can accommodate inspecting an area of conductor covered by the active width of the array in a single uni-directional scan. The array structure can flexibly conform to accommodate inspection of large, irregular, curved conductive surfaces which cannot be inspected by conventional means.
REFERENCES:
patent: 3271662 (1962-08-01), Quittner
patent: 3437918 (1967-02-01), Arnelo
patent: 4547962 (1985-10-01), deWalle et al.
patent: 4593245 (1986-06-01), Viertl et al.
patent: 4706021 (1987-11-01), Chamuel
patent: 4965519 (1990-10-01), Tornblom
patent: 5047719 (1991-09-01), Johnson et al
"Miniature Multilayer Spiral Inductors for GaAs MMICs", Geen et al., GaAs IC Symposium, Technical Digest 1989, San Diego, Calif. Oct. 22-25, 1989, pp. 303-306.
"Inspection of Electrically Conducting Objects with Eddy-Current Facilities", Shaternikov et al., The Soviet Journal of Nondestructive Testing, Jun. 1987, No. 6, New York, N.Y., USA, pp. 412-413.
"Eddy Current Imaging for Defect Characterization," David C. Copley, GE/Aircraft Engine Business Group, Evendale, Ohio, Review of Progress in Quantitative Nondestructive Evaluation, vol. 2B, Plenum Press, New York, 1983, pp. 1527-1540.
"Eddy Current Imaging," R. O. McCary, D. W. Oliver, K. H. Silverstein, and J. D. Young, IEEE Transactions on Magnetics, vol. MAG-20, No. 5, Sep. 1984, pp. 1986-1988.
"Eddy Current Imaging of Surface-Breaking Structures," R. E. Joynson, R. O. McCary, D. W. Oliver, K. H. Silverstein-Hedengren, L. L. Thumhart, GE/CR&D, Schenectady, N.Y., IEEE Transactions on Magnetics, vol. MAG-22, No, 5, Sep. 1986, pp. 1260-1262.
"Use of Imaging Techniques for Eddy Current NDE," K. H. Hedengren, R. O. McCary and J. D. Young, GE/CR&D, Schenectady, N.Y., Review of Progress in Quantitative Nondestructive Evaluation, vol. 7A, Edited by Donald Thompson and Dale E. Chimenti (Plenum Publishing Corp., 1988) pp. 357-365.
"Flexible Substrate Eddy Current Coil Arrays," Y. D. Krampfer and D. D. Johnson, Review of Progress in Quantitative Nondestructive Evaluation, vol. 7A, pp. 471-478, 1988.
"Eddy Current Probe Evaluation: Experimental Measurements & System Interaction," K. H. Hedengren, R. O. McCary and J. D. Young, GE/CR&D, Schenectady, N.Y., Review of Progress in Quanitiative Nondestructive Evaluation, vol. 8A, Edited by Donald O. Thompson and Dale E. Chimenti (Plenum Publishing Corp., 1988).
"Eddy Current Probe Analysis," T. G. Kincaid, Signametrics Report No. 7, Mar. 12, 1987 (also appearing as an appendix in a GE Final Report).
"Eddy Current Printed Circuit Probe Array: Phase IIA," T. G. Kincaid, Signametrics Report No. 10, Dec. 29, 1988 (also appearing in a GE Final Report No. 2880582Y20XG, Eddy Current Technology Department, Jan. 1989 as an appendix).
"Automating an Eddy Current Test System for In-Service Inspection of Turbine/Generator Rotor Bores," R. O. McCary, J. R. M. Viertl, GE/CR&D and GE/Power Generation, Schenectady, New York, IEEE Transactions on Magnetics, vol. 24, No. 6, Nov. 1988, pp. 2594-2596.
"Eddy Current Image Processing for Crack Size Characterization," R. O. McCary, GE Co., Corporate Research and Development, Review of Progress in Quantitative Nondestructive Evaluation, vol. 8A, Edited by D. O. Thompson and D. E. Chimenti, Plenum Press, New York, 1990, pp. 773-780.
"Eddy Current Printed Circuit Probe Array:Phase I," T. G. Kincaid, Signametrics Report No. 9, Sep. 12, 1987 (also appeared as an appendix to a GE final report).
Alley Robert P.
Charles Richard J.
Hedengren Kristina H. V.
Kornrumpf William P.
McCary Richard O.
General Electric Company
Snow Walter E.
Webb II Paul R.
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