Semiconductor integrated circuit device having low power consump

Details Semiconductor integrated circuit device having low power consump Semiconductor integrated circuit device having low power consump

1994-02-25

1995-06-27

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 104

Patent

active

054282993

ABSTRACT:
A semiconductor integrated circuit device produces an internal step-down power voltage from an external voltage for selectively distributing the internal step-down power voltage and the external voltage to the circuit components thereof, and a built-in step-down voltage generator has two internal voltage generating circuits selectively enabled with a control signal for a standard data access mode and a burn-in test operation, wherein a premonitoring circuit activates a current mirror circuit for producing the control signal when the external voltage becomes close to an accelerating voltage range for the burn-in test operation, thereby decreasing standby current in the standard data access mode.

REFERENCES:
patent: 5272393 (1993-12-01), Horiguchi et al.
patent: 5309399 (1994-05-01), Murotani
patent: 5319302 (1994-06-01), Koshikawa et al.

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