Process for fabricating a semiconductor device having floating g

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 48, 437 52, 437 49, H01L 21265

Patent

active

054279666

ABSTRACT:
Herein disclosed is a semiconductor integrated circuit device having a nonvolatile memory function and including a memory cell composed of a field effect transistor having a floating gate electrode and a control gate electrode. A first insulating film for element isolation is buried between the floating gate electrodes. The size of the drain region of the field effect transistor is substantially regulated by both the gap between the first insulating films adjacent to the drain region and the gap between the control gate electrodes adjacent to the drain region. The gaps between the data line at the connection portion with the drain region and the first insulating films individually adjacent to the drain region are equalized. The gaps between the data line at the connection portion with the drain region and the floating gate electrodes or control gate electrodes individually adjacent to the drain region are equalized.

REFERENCES:
patent: 4663645 (1987-05-01), Komori et al.
Mitchell, et al, "A New Self-Aligned Planar Array Cell for Ultra High Density EPROM", 1987 IEDM Tech. Dig. pp. 548-557.
Mukheyee, et al, IEDM Technical Digest, No. 26.1, pp. 616-619 Dec. 1985.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for fabricating a semiconductor device having floating g does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for fabricating a semiconductor device having floating g, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating a semiconductor device having floating g will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-286975

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.