Nonvolatile semiconductor memory device which stores...

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185030, C365S185210, C365S185220, C365S185280

Reexamination Certificate

active

07394697

ABSTRACT:
To enable one non-volatile memory cell to store four-value information, three different kinds of threshold voltages are serially applied to a word line in a verify operation to execute a write operation, the threshold voltages of the memory cell are controlled, and two-value (one-bit) information corresponding to the four-value (two-bit) information to be written are synthesized by a write data conversion circuit for each of the write operations carried out three times. In this way, the four-value (two-bit) information are written into one memory cell, and the memory capacity of the memory cell can be increased. In the information read operation, three different kinds of voltages are applied to a word line, three kinds of two-value (one-bit) information so read out are synthesized by a read conversion circuit and the memory information of the memory cell are converted to the two-bit information.

REFERENCES:
patent: 4964079 (1990-10-01), Devin
patent: 5138576 (1992-08-01), Madurawe
patent: 5172338 (1992-12-01), Mehrotra et al.
patent: 5365486 (1994-11-01), Schreck
patent: 5436913 (1995-07-01), Yamamura et al.
patent: 5555204 (1996-09-01), Endoh
patent: 5570315 (1996-10-01), Tanaka et al.
patent: 5602789 (1997-02-01), Endoh et al.
patent: 5621682 (1997-04-01), Tanzawa et al.
patent: 5802551 (1998-09-01), Komatsu et al.
patent: 5870218 (1999-02-01), Jyouno et al.
patent: 5973956 (1999-10-01), Blyth et al.
patent: 5982667 (1999-11-01), Jyouno et al.
patent: 6181603 (2001-01-01), Jyouno et al.
patent: 6396736 (2002-05-01), Jyouno et al.
patent: 6771537 (2004-08-01), Jyouno et al.
patent: 7031187 (2006-04-01), Jyouno et al.
patent: 2006/0114718 (2006-06-01), Jyouno et al.
patent: 626493 (1987-02-01), None
patent: 6234398 (1987-02-01), None
patent: 62257699 (1987-11-01), None
patent: 62298999 (1987-12-01), None
patent: 63276791 (1988-11-01), None
patent: 1134793 (1989-05-01), None
patent: 01159895 (1989-06-01), None
patent: 1273294 (1989-11-01), None
patent: 240198 (1990-02-01), None
patent: 2260298 (1990-10-01), None
patent: 3237692 (1991-10-01), None
patent: 457294 (1992-02-01), None
patent: 04057294 (1992-02-01), None
patent: 4184794 (1992-07-01), None
patent: 4238196 (1992-08-01), None
patent: 5210991 (1993-08-01), None
patent: 660674 (1994-03-01), None
patent: 06131881 (1994-05-01), None
patent: 06195987 (1994-07-01), None
patent: 06215497 (1994-08-01), None
patent: 6251591 (1994-09-01), None
patent: 06267285 (1994-09-01), None
patent: 06282992 (1994-10-01), None
patent: 06309890 (1994-11-01), None
patent: 793979 (1995-04-01), None
patent: 7169284 (1995-07-01), None
patent: 991971 (1997-04-01), None
patent: 7241116 (1997-04-01), None
1994 Symposium on VLSI Circuits Digest of Technical Paper, High Speed Programming and Program-verify Methods Suitable for Low Voltage Flash Memories, by T. Tanaka, et al., pp. 6 62.
Digest of Technical Papers, TP 2.1:A3.3V 12Mb Multi-level NAND Flash Memory for Mass Storage Applications, T. Jung, et al., ISSCC96/Session 2 Flash Memory/Paper TP 2.1, 1996 IE International Solid State Circuits Conf.

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