Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-07-29
2008-07-29
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S691000, C324S525000, C324S756010, C324S757020
Reexamination Certificate
active
07405578
ABSTRACT:
The invention relates to a device that can be used to monitor the contact integrity of a joint that is of an impervious contact surface between two parts (4and5) including a set of conductive patterns (8) which are distributed over the two contact surfaces (1and2) and which are separated by insulating zones (9). When the aforementioned two parts (4and5) are brought into contact, the conductive patterns (8) also come into contact and form a conductor between the two measuring points (6and7), which is made by positioning the resistances of the patterns (8) in series. Any local change in the contact between the patterns causes the intensity and voltage between points (6) and (7) to vary and is measured with a measuring device (22). The invention is particularly suitable for the detection of an intrusion or a leak between two sealed contact parts.
REFERENCES:
patent: 4503710 (1985-03-01), Oertle et al.
patent: 5969532 (1999-10-01), Usui et al.
patent: 6906541 (2005-06-01), Kimura
patent: 2006/0012375 (2006-01-01), Kelsey et al.
He Amy
Nguyen Vincent Q.
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