Rotation rate sensor with built in test circuit

Details Rotation rate sensor with built in test circuit Rotation rate sensor with built in test circuit

1993-08-02

1995-06-27

Williams, Hezron E.

Measuring and testing

Instrument proving or calibrating

Volume of flow, speed of flow, volume rate of flow, or mass...

73517A, 73517AV, 73517R, 310316, 310370, G01P 1509, G01P 2100, H01L 41107

Patent

active

054269709

ABSTRACT:
A rotation rate sensor which employs a built-in (i.e. internal) test circuit. The rotation rate sensor includes a piezoelectric structure. Deposited on the piezoelectric structure are at least two pickup high and two pickup low electrodes. A pickup circuit is coupled to the pickup high and pickup low electrodes. During a normal mode of operation, the piezoelectric structure is subject to a rotation about one of its axis. In response, the pickup circuit generates a rate signal which corresponds to the rotation rate of the piezoelectric structure. The test circuit is coupled to the pickup low electrodes. During a test mode of operation, the piezoelectric structure is also subject to a rotation about the axis. But, the test circuit generates at the same time a test signal which is provided to the pickup low electrodes and which corresponds to a pseudo rate of rotation. In response, the pickup circuit generates a rate signal which corresponds to the sum of the actual rate of rotation of the piezoelectric material plus the pseudo rate of rotation.

REFERENCES:
patent: Re32931 (1989-05-01), Staudte
patent: Re33479 (1990-12-01), Juptner et al.
patent: 4538461 (1985-09-01), Juptner
patent: 4628734 (1986-12-01), Watson
patent: 4654663 (1987-03-01), Alsenz
patent: 4898032 (1990-02-01), Voles
patent: 4899587 (1990-02-01), Staudte
patent: 4930351 (1990-06-01), Macy
patent: 5056366 (1991-10-01), Fersht

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