Method and system for processing commonality of...

Details Method and system for processing commonality of... Method and system for processing commonality of...

2008-01-15

2008-01-15

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

C702S081000, C702S181000, C702S183000, C700S121000

Reexamination Certificate

active

07319938

ABSTRACT:
A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.

REFERENCES:
patent: 6754569 (2004-06-01), Bechhoefer
patent: 6828776 (2004-12-01), Tai et al.
patent: 7003430 (2006-02-01), Wang et al.
patent: 2003/0229462 (2003-12-01), Wang
Wang, “Sameness—An Equivalency Index of Products, Processes and Services”, 2002 Hawaii International Conference on Statistics, Jun. 5-9, 2002, pp. 1-5.

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