Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2008-01-01
2008-01-01
Rosasco, S. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
Reexamination Certificate
active
07314690
ABSTRACT:
In a method of producing a photomask (10) in which a light-transmissive substrate (1) is formed thereon with a chromium pattern (21) having a global opening ratio difference in its plane on the light-transmissive substrate (1), use is made, as an etching mask for a chromium film (2), of an etching mask pattern (31) made of an inorganic-based material having a resistance against etching of the chromium film (2). Dry etching of the chromium film (2) is carried out under a condition selected from conditions that cause damage to a resist pattern (41) to a degree which is unallowable when etching the chromium film (2) using the resist pattern (41) as a mask.
REFERENCES:
patent: 6472107 (2002-10-01), Chan
patent: 6682861 (2004-01-01), Chan
patent: 7115341 (2006-10-01), Shiota et al.
patent: 2004/0101764 (2004-05-01), Nyhus et al.
patent: 61-138256 (1986-06-01), None
patent: 63-39892 (1988-08-01), None
patent: 7-49558 (1995-02-01), None
patent: 8-234410 (1996-09-01), None
patent: 10-69055 (1998-03-01), None
patent: 2000-181049 (2000-06-01), None
patent: 2001-183809 (2001-07-01), None
VLSI Synthetic Dictionary (Science Forum) (a part of p. 865).
Submicron Lithography “Synthetic Technological Material Collection” (a part of p. 353).
Hara Mutsumi
Okubo Yasushi
Hoya Corporation
Rosasco S.
Sughrue & Mion, PLLC
LandOfFree
Photomask producing method and photomask blank does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Photomask producing method and photomask blank, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photomask producing method and photomask blank will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2793509