Voltage testing and measurement

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07323889

ABSTRACT:
An improved voltage test system.

REFERENCES:
patent: 3663194 (1972-05-01), Greenstein et al.
patent: 3956698 (1976-05-01), Malkmberg et al.
patent: 4053833 (1977-10-01), Malmberg et al.
patent: 4242635 (1980-12-01), Burns
patent: 4355278 (1982-10-01), Burns et al.
patent: 4415851 (1983-11-01), Langner et al.
patent: 4482863 (1984-11-01), Auston et al.
patent: 4554453 (1985-11-01), Feigt et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4681449 (1987-07-01), Bloom et al.
patent: 4703260 (1987-10-01), Beha et al.
patent: 4714826 (1987-12-01), Goutzoulis
patent: 4745361 (1988-05-01), Nees et al.
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 4760249 (1988-07-01), Baskett
patent: 4786864 (1988-11-01), Beha et al.
patent: 4816755 (1989-03-01), Look et al.
patent: 4827212 (1989-05-01), Kamieniecki
patent: 4843329 (1989-06-01), Beha et al.
patent: 4868492 (1989-09-01), Beha et al.
patent: 4875006 (1989-10-01), Henley et al.
patent: 4881029 (1989-11-01), Kawamura
patent: 4896109 (1990-01-01), Rauscher
patent: 4933634 (1990-06-01), Cuzin et al.
patent: 4970461 (1990-11-01), LePage
patent: 4983911 (1991-01-01), Henley
patent: 4999577 (1991-03-01), Beha et al.
patent: 5034683 (1991-07-01), Takahashi et al.
patent: 5059897 (1991-10-01), Aton et al.
patent: 5216359 (1993-06-01), Makki et al.
patent: 5407850 (1995-04-01), Doyle et al.
patent: 5438439 (1995-08-01), Mok et al.
patent: 5570011 (1996-10-01), Henley
patent: 5895972 (1999-04-01), Paniccia
patent: 5930588 (1999-07-01), Paniccia
patent: 5969517 (1999-10-01), Rao
patent: 6075908 (2000-06-01), Paniccia et al.
patent: 6084396 (2000-07-01), Rao
patent: 6163378 (2000-12-01), Khoury
patent: 6166846 (2000-12-01), Maloney
patent: 6231194 (2001-05-01), Raj et al.
patent: 6246098 (2001-06-01), Paniccia
patent: 6251706 (2001-06-01), Paniccia
patent: 6269199 (2001-07-01), Maloney
patent: 6323985 (2001-11-01), Maloney
patent: 6374003 (2002-04-01), Ding et al.
patent: 6421473 (2002-07-01), Paniccia et al.
patent: 6434289 (2002-08-01), Paniccia et al.
patent: 6449405 (2002-09-01), Paniccia et al.
patent: 6458495 (2002-10-01), Tsai et al.
patent: 6463193 (2002-10-01), Paniccia et al.
patent: 6470104 (2002-10-01), Paniccia et al.
patent: 6480641 (2002-11-01), Ding et al.
patent: 6483954 (2002-11-01), Koehl et al.
patent: 6501092 (2002-12-01), NiKonor et al.
patent: 6522812 (2003-02-01), NiKonor
patent: 6548417 (2003-04-01), Dao et al.
patent: 6566679 (2003-05-01), NiKonor et al.
patent: 6600760 (2003-07-01), Green et al.
patent: 6600864 (2003-07-01), Samara-Rubin et al.
patent: 6631146 (2003-10-01), Pontis et al.
patent: 6642531 (2003-11-01), Powers
patent: 6650802 (2003-11-01), Morse et al.
patent: 6653161 (2003-11-01), Morse
patent: 6658031 (2003-12-01), Tuganov et al.
patent: 6660649 (2003-12-01), Dao et al.
patent: 6665321 (2003-12-01), Sochava et al.
patent: 6687269 (2004-02-01), Rice et al.
patent: 6704332 (2004-03-01), Chapman et al.
patent: 6724790 (2004-04-01), Daiber et al.
patent: 6751002 (2004-06-01), Ovadia et al.
patent: 6763047 (2004-07-01), Daiber et al.
patent: 6778102 (2004-08-01), Grunnet-Jepsen et al.
patent: 6778750 (2004-08-01), Vodrahall et al.
patent: 6782164 (2004-08-01), Lee et al.
patent: 6785430 (2004-08-01), Paniccia
patent: 6788724 (2004-09-01), Sell et al.
patent: 6788727 (2004-09-01), Liu
patent: 6803777 (2004-10-01), Pfaff et al.
patent: 6804278 (2004-10-01), Daiber
patent: 6816516 (2004-11-01), Daiber
patent: 6822979 (2004-11-01), Daiber
P. Haribaran, “Optical Holigraphy: Principles, Techniques, and Applications”, 2nded. Cambridge University Press 1996.
Graham Saxby, Practical Display Holography, Chapter 20—“Embossed Holograms” 1988.
Handbook of Infrared Optical Materials, Paul Klocek ed. 1991.
O'Regan and Dudderar, “A new Holographic Inferometer for Stress Analysis” Experimental Mechanics Jun. 1971.
Heinrich et al. “Measurement of Real Time Digital Signals in a Silicon Bipolar Junction Transistor Using a Noninvasive Optical Probe” May 6, 2001.
Heinrich et al. “Noninvasive Sheet Charge Density Probe for Integrated Silicon Devices” Feb. 3, 2005.
Woerdman “Formation of a Transient Free Carrier Hologram in Si” Optics Communications Oct. 1970.
Kaminow and Turner, “Electrooptic Light Modulators” Proceedings of the IEEE, vol. 54 pp. 10 Oct. 1966.
Paritskii and Ryvkin, “Use of Semiconductors in Long-Wavelength Photography” Soviet Physics—Semiconductors Oct. 1970.
Soviet Physics—Semiconductors (excerpts), Feb. 4, 1981.
Heggarty and Chevallier “Signal Window Minimum Average Error Algorithm for Computer Generated Holograms” J. Opt. Soc. Am. Mar. 1988.
Yu, et al., “Direct Measurement of the Refractive Index Change of Silicon with Optically Injected Carriers” Appl. Phys. Lett. 1996.
Schmidt-Tiedmann “Experimental Evidence of Birefringence by Free Carriers in Semiconductors” Physical Review Letters Nov. 15, 1961.
Vanin, “Influence of the Polarization of the Object and Reference Waves on the Hologram Quality” 1979.
Thompson, “Holographic Particle Sizing Techniques” Apr. 15, 2000.
Applied Physics Letters (excerpts) Jan. 1969.
Dickson et al., “Holographic Polarization Separation Elements” Applied Optics Aug. 10, 1994.
Lohmann, “Reconstruction of Vectorial Wavefronts” Applied Optics, 1967.
Kotani et al., 5.6 ps Gate Delay All Refractory Josephson OR Gate with Modified Variable Threshold Logic 1985.
Hariharan, Simple Laser Inferometer with Variable Shear and Tilt. Applied Optics May 1975.
D.N. Goryachev et al., Photographic Process Based On Oxidation-Reduction Reactions On Thin Films Of Lead Sulfide And Selenide, Soviet Physics—Semiconductors, Feb. 1971, vol. 4, No. 8, Leningrad, USSR.
D.N. Goryachev et al., Photographic Process Based On Oxidation-Reduction Reactions On The Surface Of Silicon, Soviet Physics—Semiconductors, Feb. 1971, vol. 4, No. 8, Leningrad, USSR.
Zh. D.N. Goryachev et al., Photographic Process Based On Photoelectric Action Of A Surface-Barrier Junction in Silicon, Soviet Physics—Semiconductors, Feb. 1971, vol. 4, No. 8, Leningrad, USSR.
G.B. Gorlin et al., Possible Use Of The Semiconductor—Dielectric Electrophotographic System In Long-Wavelength Semiconductor Photography, Soviet Physics-Semiconductors, Aug. 1972, vol. 6, No. 2, Leningrad, USSR.
G.B. Abdllaev, Formation Of Photographic Images on Thin Films Of Gallium and Indium Selenides, Soviet Physics-Semiconductors, Dec. 1972, vol. 6, No. 6, Leningrad, USSR.
Takashi Nakashima et al., Optical Time Domain Reflectometer with a Laser Diode Operating as Light Emitter/Photodetector, Japanese Journal of Applied Physics, Feb. 1985, vol. 24, No. 2, pp. L135-136.
Letters to the Editor, pp. 2058 & 2059, Feb. 3, 2005.
Kurt J. Weingarten et al., Picosecond Optical Sampling of GaAs Integrated Circuits, IEEE Journal of Quantum Electronics, Feb. 1988, vol. 24 No. 2.
L. Ek et al., Detection of the Nodal Lines and the Amplitude of Vibration by Speckle Interferometry, Optics Communications, Feb. 1971, vol. 2, No. 9.
Ichirou Yamaguchi et al., Phase-shifting Digital Holography, Optics Letters, Aug. 14, 1997, vol. 22, No. 16.
Daniele et al., “Photoelectric Effect from a Metal Surface: A Revised Theroretical Model” J. Opt. Soc. Am. Oct. 1992.
Saito et al., Enhancement of a Sensitivity by Stratifying a Photoconductor on Thermoplastic-Photoconductor Media J. Optics 1981.
Groh and Marie, Information Input in an Optical Pattern Recognition System Using a Relay Tube Based on the Pockets Effect Optics Communicaitons Aug. 1970.
Kolner and Bloom, Electrooptic Sampling in GaAs Integrated Circuits, Journal of Quantum Electronics, Jan. 1986.
Asundi and Yung, Phase Shifting and Logical Moire, J. Opt. Soc. Am. Oct. 1991.
Mandelis, Laser Infrared Photothermal Radiometry ofSemiconductrs: Principles and Applications, Solid State Electronics 1998.
Caulfield, A New Approach to Computer Holography, Optics Communi

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