Method and module with analog-to-digital converter

Details Method and module with analog-to-digital converter Method and module with analog-to-digital converter

2011-08-09

2011-08-09

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S155000

Reexamination Certificate

active

07994953

ABSTRACT:
A method and module with analog-to-digital converter. One embodiment provides for testing an analog-to-digital converter, including generating a voltage ramp. The voltage ramp is converted to a digital signal using the ADC at a rate of a clock signal. A first parameter is calculated according to the clock signal and the digital signal on the chip. The first parameter is indicative of conversion characteristics of the ADC.

REFERENCES:
patent: 6299465 (2001-10-01), Hirata
patent: 6333706 (2001-12-01), Cummings et al.
patent: 6549150 (2003-04-01), Bulaga et al.
patent: 6557131 (2003-04-01), Arabi
patent: 7319424 (2008-01-01), Stewart
patent: 2006/0155486 (2006-07-01), Walsh et al.
“A low-cost adaptive ramp generator for analog BIST applications”, F. Azais, et al., VLSI test Symposium, 19th IEEE Proceedings on. VTS 2001, pp. 266-271.

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