Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2008-05-27
2008-05-27
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C702S086000, C702S090000, C702S182000
Reexamination Certificate
active
07379831
ABSTRACT:
An analog-to-digital converter (ADC) exhibiting an uncorrected non-linear transfer function receives measured analog voltage amplitudes and outputs uncorrected digital values. A calibration circuit receives each uncorrected digital value and outputs a corrected digital value. The measured analog voltage amplitudes received by the ADC and the corresponding corrected digital values output by the calibration circuit define points approximating an ideal linear transfer function of the ADC. The calibration circuit performs piecewise-linear approximation of the uncorrected transfer function and associates each uncorrected digital value with one of N linear segments that join at inflection points on the uncorrected transfer function. The inflection points are determined using the second derivative of the uncorrected transfer function. The calibration circuit calculates each corrected digital value using no more than 2N+2 stored calibration coefficients. Calibration coefficients that are not stored in non-volatile memory are calculated upon power up using stored calibration coefficients.
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Assouad Patrick
Imperium Patent Works
Suarez Felix
Wallace Darien K.
Zilog Inc.
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