Ultra-short low-force vertical probe test head

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07394266

ABSTRACT:
A playground play feature comprising a track having a glide board thereon, such that a user may run and jump onto the glide board and propel the board along the length of the track. The glide board further can comprise a rubber, or similar material, covered board having wheels, the wheels designed to fit within angled side rails, so that the glide board is held onto the track along the entire length of the track. The track further comprises shock absorbing end caps so as to more controllably stop the glide board as it nears the end of the track.

REFERENCES:
patent: 4724383 (1988-02-01), Hart
patent: 5252916 (1993-10-01), Swart
patent: 5389885 (1995-02-01), Swart
patent: 5990697 (1999-11-01), Kazama
patent: 6084421 (2000-07-01), Swart et al.
patent: 6356098 (2002-03-01), Akram et al.
“COBRA Vertical Technology Probe Cards”, Available from http://www.wentworthlabs.com/product/cobra.htm, 3 pages.
“Yield-Enhancing WaferProbe PH-Series Probe Cards”, Available from http://www.formfactor.com/FormFactor%20Online/downloadables/WaferProbe%20PH-Series.pdf,2 pages.
“ U.S. Appl. No. 10/335,188 Final office action mailed Jun. 8, 2004”, 8 pgs.
“ U.S. Appl. No. 10/335,188 Non-final office action mailed Jan. 7, 2004”, 8 pgs.
“ U.S. Appl. No. 10/335,188 Notice of allowance mailed May 3, 2006”, 7 pgs.
“ U.S. Appl. No. 10/335,188 Notice of allowance mailed Dec. 9, 2004”, 5 pgs.
“ U.S. Appl. No. 10/335,188 Response filed Mar. 8, 2004”, 29 pgs.
“U.S. Appl. No. 10/335,188 Response filed Sep. 8, 2004 in response to Final Office Action mailed Jun. 8, 2004”, 12 pgs.
“U.S. Appl. No. 10/335,188 Response filed Nov. 8, 2004 in response to Final Office Action mailed Sep. 8, 2004”, 7 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Ultra-short low-force vertical probe test head does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ultra-short low-force vertical probe test head, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ultra-short low-force vertical probe test head will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2785430

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.