Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-08-16
2011-08-16
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07999948
ABSTRACT:
An interferometric system which includes an illumination arm having a light source and an illumination optical system for forming an illumination beam path; an object arm having a special-purpose optical system for measuring an object for the purpose of forming an imaging beam path; a reference arm having an adjusting element and a reference element coupled thereto; a detector arm having a detector; and a beam splitter, an at least partially transparent dispersion-compensating medium being provided in the reference arm for compensating the dispersion of the optical components of the object arm, the dispersion-compensating medium being exchangeable and also being adjusted to the special-purpose optical system. This enables a universal white light interferometer platform to be provided for enabling different measuring tasks to be carried out simply by exchanging the special-purpose optical systems.
REFERENCES:
patent: 5390023 (1995-02-01), Biegen
patent: 5975697 (1999-11-01), Podoleanu et al.
patent: 6191862 (2001-02-01), Swanson et al.
patent: 2003/0011784 (2003-01-01), De Groot et al.
patent: 2003/0048532 (2003-03-01), Lindner et al.
patent: 2004/0059540 (2004-03-01), Matsumoto et al.
patent: 2006/0238774 (2006-10-01), Lindner et al.
patent: 43 09 056 (1994-09-01), None
patent: 100 47 495 (2001-10-01), None
patent: 101 15 524 (2001-11-01), None
patent: 101 62 180 (2003-07-01), None
patent: 2008520053 (2003-09-01), None
patent: 2008529753 (2003-10-01), None
patent: 92 19930 (1992-11-01), None
patent: WO 01/27558 (2001-04-01), None
patent: WO 01/75395 (2001-10-01), None
M.W. Lindner “White Light Interferometry Via an Endoscope”, Jul. 8-10, 2002 , Proc SPIE, vol. 4777, pp. 90-101.
Kenyon & Kenyon LLP
Lyons Michael A
Robert & Bosch GmbH
LandOfFree
Interferometric system for the use of special-purpose... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interferometric system for the use of special-purpose..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric system for the use of special-purpose... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2778927