Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate
2011-03-08
2011-03-08
Donovan, Lincoln (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
C327S537000
Reexamination Certificate
active
07902902
ABSTRACT:
The present invention relates to an anti-fuse repair control circuit which regulates transmission of a power voltage and a back-bias voltage that are converted to repair an anti-fuse to a circuit part. As such, the present invention prevents the influence of a high power voltage or a low back-bias voltage on a circuit part such as a cell, a peripheral circuit, or a core region during an anti-fuse repair. The anti-fuse repair control circuit includes an anti-fuse repair enabling part providing an anti-fuse repair enabling signal corresponding to a repair of an anti-fuse; a power voltage control part controlling transmission of a power voltage to a first circuit part according to an enablement state of the anti-fuse repair enabling signal; and a back-bias voltage control part controlling transmission of a back-bias voltage to a second circuit part according to the enablement state of the anti-fuse repair enabling signal.
REFERENCES:
patent: 5838624 (1998-11-01), Pilling et al.
patent: 5841723 (1998-11-01), Ma
patent: 6091282 (2000-07-01), Kim
patent: 6108261 (2000-08-01), Kim et al.
patent: 6329869 (2001-12-01), Matano
patent: 6384666 (2002-05-01), Bertin et al.
patent: 6545926 (2003-04-01), Ooishi et al.
patent: 6927997 (2005-08-01), Lee et al.
patent: 7075357 (2006-07-01), Koshita
patent: 7130207 (2006-10-01), Fricke et al.
patent: 7196547 (2007-03-01), Kozawa
patent: 7230475 (2007-06-01), Choi et al.
patent: 2009/0141577 (2009-06-01), Chu et al.
patent: 1020000050452 (2000-08-01), None
patent: 1020000050453 (2000-08-01), None
patent: 2000-0062452 (2000-10-01), None
Chu Shin Ho
Koh Min Jung
Chen Sibin
Donovan Lincoln
Hynix / Semiconductor Inc.
Ladas & Parry LLP
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