Monolithic quadrature detector

Optics: measuring and testing – By light interference – Having polarization

Reexamination Certificate

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Details

C356S495000, C356S498000, C356S511000

Reexamination Certificate

active

07315381

ABSTRACT:
A compact monolithic quadrature detector generates four signals from an input beam including orthogonally polarized object and reference beam components provided by an interferometer. The single input beam may be split into four output beams using a first beam splitting interface between two prisms, reflections at two air interface surfaces of the prisms, and a second beam splitting element. Different respective predetermined phase shifts may be imposed on the respective output beams by coatings on the beam splitting surfaces, which impart a different phase shift to the components of a transmitted beam as compared to a reflected beam. The four relatively phase shifted output beams may be directed through polarizers onto respective detectors to provide four signals usable to eliminate many common mode errors and determine the phase difference between the components of the original input beam with high accuracy.

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W. H. Southwell, “Multilayer coating design achieving a broadband 90° phase shift,” Appl. Opt. 19, 2688-2692 (1980).

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