Semiconductor integrated circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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Details

C327S003000, C327S147000, C327S261000, C327S291000

Reexamination Certificate

active

07915932

ABSTRACT:
A semiconductor integrated circuit comprises: a first signal delay circuit including a first precharge element configured to precharge a first node with a leakage current and a first signal output circuit configured to output a first signal; a second signal delay circuit including a second precharge element configured to precharge a second node with a leakage current and a second signal output circuit configured to output a second signal. The first signal delay circuit is configured to discharge the first node via a first discharge element, while the second signal delay circuit precharges the second node via the second precharge element and outputs the second signal. The second signal delay circuit is configured to discharge the second node via a second discharge element, while the first signal delay circuit precharges the first node via the first precharge element and outputs the first signal.

REFERENCES:
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patent: 6801094 (2004-10-01), Aoki et al.
patent: 6882172 (2005-04-01), Suzuki et al.
patent: 6885210 (2005-04-01), Suzuki
patent: 7423456 (2008-09-01), Gomm et al.
patent: 7538591 (2009-05-01), Oh
patent: 11-101851 (1999-04-01), None
patent: 2008-102083 (2008-05-01), None
James W. Tschanz et al., “Effectiveness of Adaptive Supply Voltage and Body Bias for Reducing Impact of Parameter Variations in Low Power and High Performance Microprocessors”, IEEE Journal of Solid-State Circuits, vol. 38, No. 5, May 2003, pp. 826-829.

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