Semiconductor integrated circuit, debug/trace circuit and...

Details Semiconductor integrated circuit, debug/trace circuit and... Semiconductor integrated circuit, debug/trace circuit and...

2011-03-22

2011-03-22

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C717S124000

Reexamination Certificate

active

07911216

ABSTRACT:
A main functional structure executes continuous predetermined operations to continuously generate events associated with the operations. A debug/trace circuit compares an event occurring at the main functional structure with detection condition indicating information of one entry in a control information list, and executes the operation designated by operation indicating information paired with the detection condition indicating information in accordance with the result of the comparison. The debug/trace circuit continuously performs this in accordance with the control information list to identify the event.

REFERENCES:
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International Search Report for PCT/JP2008/051078 mailed Feb. 26, 2008.

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