Signal test procedure for testing semi-conductor components...

Details Signal test procedure for testing semi-conductor components... Signal test procedure for testing semi-conductor components...

2008-01-08

2008-01-08

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C324S763010

Reexamination Certificate

active

07317323

ABSTRACT:
The invention relates to a test apparatus for testing semi-conductor components, and to a signal testing procedure, to be used especially during the testing of semi-conductor components. A signal is applied to a connection of a semi-conductor component, a reference signal is applied at a particular voltage level to a further connection of the semi-conductor component, the signal is compared with the reference signal, the voltage level of the reference signal is changed, and the signal is compared with the reference signal.

REFERENCES:
patent: 3772595 (1973-11-01), De Wolf et al.
patent: 3976940 (1976-08-01), Chau et al.
patent: 6657452 (2003-12-01), Beer et al.
patent: 6747470 (2004-06-01), Muhtaroglu et al.
patent: 6879175 (2005-04-01), Conner
patent: 2002/0109524 (2002-08-01), Hartmann
patent: 2003/0046624 (2003-03-01), Muhtaroglu
patent: 101 07 180 (2002-09-01), None

Affiliated with

Also associated with

Rating

Signal test procedure for testing semi-conductor components... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Signal test procedure for testing semi-conductor components..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal test procedure for testing semi-conductor components... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2764217