Method and apparatus for testing electronic device

Details Method and apparatus for testing electronic device Method and apparatus for testing electronic device

2011-08-02

2011-08-02

Phan, Huy (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07990172

ABSTRACT:
An electronic device test method incorporating a stress application step that is effective in screening out infant mortality failures of an electronic device. More specifically, a method for testing an electronic device constructed from a single or a plurality of semiconductor components, includes: turning a power supply on and off repeatedly while changing the ON/OFF cycle and/or voltage value of the power supply that is connected to the electronic device; and verifying whether or not the electronic device operates normally after the power supply has been turned on and off repeatedly.

REFERENCES:
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International Search Report of PCT/JP2007/061109, date of mailing Sep. 4, 2007.

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