Random number test circuit

Electrical computers: arithmetic processing and calculating – Electrical digital calculating computer – Particular function performed

Reexamination Certificate

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Reexamination Certificate

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07917560

ABSTRACT:
The random number test circuit includes a shift register which operates based on a clock and which successively stores serial random numbers generated by a random number generation element, a first random number being output from a predetermined stage of the shift register; a comparison circuit which compares the first random number with a second random number located at a distance of a first predetermined number of bits from the first random number, the second random number being generated by the random number generation element; a counter which counts a frequency of occurrence of equality or inequality between the first random number and the second random number, with respect to all bits in the serial random numbers, and a decision circuit which judges an article quality to be good if a count value in the counter indicates a frequency of occurrence equal to or less than a number determined previously by correlation.

REFERENCES:
patent: 4071903 (1978-01-01), Head et al.
patent: 6844234 (2005-01-01), Eguchi et al.
patent: 2003/0061250 (2003-03-01), Fujita et al.
patent: 2003/0158875 (2003-08-01), Hars
patent: 2004/0061538 (2004-04-01), Yasuda et al.
patent: 2005/0108308 (2005-05-01), Yasuda et al.
patent: 2005/0204220 (2005-09-01), Yasuda et al.
patent: 1 489 489 (2004-12-01), None
patent: 2 144 044 (1985-02-01), None
patent: 2003-196081 (2003-07-01), None
patent: 3487300 (2003-10-01), None
patent: 2004-310314 (2004-11-01), None
patent: 2005-518046 (2005-06-01), None
Notification of Reasons for Rejection issued by the Japanese Patent Office on Feb. 20, 2009, for Japanese Patent Application No. 2005-359236, and English-language translation thereof.
Donald E. Knuth, “The Art of Computer Programming,” Addison-Wesley (1998), title pages and pp. v-vii, xii, xiii, and 60-75.
Solomon W. Golomb, “Shift Register Sequences,” Aegean Park Press (1982), title pages and pp. xiv-xvi and 24-27.
Decision of Final Rejection issued by the Japanese Patent Office on Jun. 30, 2009, for Japanese Patent Application No. 2005-359236, and English-language translation thereof.
European Search Report issued by the European Patent Office on Jul. 31, 2008, for European Patent Application No. 06 25 6186.
Menezes et al., Handbook of Applied Cryptography (Jan. 1, 1997), pp. 181-182.
Kazumasa Wakimoto, “Knowledge of Random Numbers,” pp. 48-54, published in 1970.

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