Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2011-03-15
2011-03-15
Dzierzynski, Evan (Department: 2875)
Optics: measuring and testing
Lamp beam direction or pattern
C356S213000, C362S460000
Reexamination Certificate
active
07907261
ABSTRACT:
An optical axis inspection apparatus is provided with: a camera for capturing a light distribution pattern of a light source device projected on a screen; an image processing device for finding a cutoff line in the light distribution pattern; an acceptance reference cutoff line setting unit; and a shade having an oblong slit and arranged to be opposed to a projection lens of the projection type light source device. Whether or not an optical axis is proper is inspected based oh a shift of the cutoff line with respect to the acceptance reference cutoff line. Only a transmissive light passing through a substantially central portion in a vertical direction of a projection lens including an optical axis of the projection lens is guided onto the screen by the shade.
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Dzierzynski Evan
Koito Manufacturing Co. Ltd.
Osha & Liang LLP
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