Manufacturing method of a tray, a socket for inspection, and...

Details Manufacturing method of a tray, a socket for inspection, and... Manufacturing method of a tray, a socket for inspection, and...

2011-03-29

2011-03-29

Picardat, Kevin M (Department: 2822)

Semiconductor device manufacturing: process

With measuring or testing

C438S464000, C438S465000, C324S758010

Reexamination Certificate

active

07915057

ABSTRACT:
The yield of semiconductor devices is to be enhanced. A tray is provided with a plurality of pockets each capable of accommodating a wafer level CSP, and each of the pockets is provided with a base for supporting a plurality of bumps of the wafer level CSP and side walls formed around the base. In the step-to-step carriage in the post-production process of the manufacture of wafer level CSPs and on like occasions, the base supports not the organic film but the plurality of solder bumps. For this reason, it is made possible to prevent the organic film from being flawed or coming off and adhering to the product as foreign matter, and as a result the quality and yield of the wafer level CSPs (semiconductor devices) can be improved.

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Japanese Official Action issued on Nov. 24, 2009, for Application No. 2004-070476.

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