Method and apparatus for identifying outliers following...

Details Method and apparatus for identifying outliers following... Method and apparatus for identifying outliers following...

2011-08-30

2011-08-30

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C438S014000, C702S081000

Reexamination Certificate

active

08010310

ABSTRACT:
A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.

REFERENCES:
patent: 6184048 (2001-02-01), Ramon
patent: 7340359 (2008-03-01), Erez et al.
patent: 7494829 (2009-02-01), Subramaniam et al.
Jason Allen Pharis “Outlier model using FMAX to predict failing devices”, Texas Tech University, Aug. 2005.

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