Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-07-19
2011-07-19
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07982475
ABSTRACT:
There is provided a method for measuring thermal properties of a semiconductor packaging material. The method includes incorporating at least one conducting feature into a substrate that includes the semiconductor packaging material, applying an electric current to the feature, and measuring a change in temperature of a region of the substrate around the feature as a result of the electric current. There is also provided a test vehicle for measuring thermal properties of a semiconductor packaging material.
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Malfatt Ronald S
Oggioni Stefano S
Russell David J
Wakil Jamil A
Abate Joseph P.
Hollington Jermele M
International Business Machines - Corporation
Ohlandt Greeley Ruggiero & Perle LLP
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