Phase detecting apparatus, test apparatus and adjusting method

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage

Reexamination Certificate

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C324S076770

Reexamination Certificate

active

07999531

ABSTRACT:
Provided is a phase detecting apparatus that detects a phase difference between signals, comprising a phase comparing section that sequentially delays a second input signal relative to a first input signal, according to a set value, and that compares a phase of the second input signal to a phase of the first input signal each time a relative phase between the input signals changes; and a delay adjusting section that adjusts in advance a delay amount of a signal in the phase comparing section. The delay adjusting section includes a signal generating section that generates a first adjustment signal and a second adjustment signal, which has a period that is shorter than a period of the first adjustment signal by an amount corresponding to the set value, and inputs the first adjustment signal and the second adjustment signal to the phase comparing section as the first input signal and the second input signal, respectively; and an adjusting section that adjusts a delay amount of the phase in the phase comparing section based on the phase comparison result by the phase comparing section between the first adjustment signal and the second adjustment signal.

REFERENCES:
patent: 7304510 (2007-12-01), Matsuta
patent: 7855607 (2010-12-01), Shimamoto
patent: 2003/0006750 (2003-01-01), Roberts et al.
patent: 2007/0085570 (2007-04-01), Matsuta
patent: 2009/0048796 (2009-02-01), Yamamoto et al.
patent: 2009/0216488 (2009-08-01), Baba et al.
patent: 2001-108725 (2001-04-01), None
patent: 2004-61339 (2004-02-01), None
patent: 2004-239666 (2004-08-01), None
patent: 2005-521059 (2005-07-01), None
patent: 2006/041162 (2006-04-01), None
patent: 2007-110370 (2007-04-01), None
patent: 2008/108374 (2008-09-01), None
patent: 2009/022691 (2009-02-01), None
International Search Report (ISR) issued in PCT/JP2009/002843 (parent application) mailed in Oct. 2009 for Examiner consideration, citing U.S. Patent Application Publication Nos. US2007/85570, US2009/48796, US2003/6750, and Foreign Patent document Nos. JP2007-110370, WO2009/022691, JP2005-521059, WO2006/041162, WO2008/108374, JP2001-108725, and JP2004-61339 which have been submitted with Japanese ISR in a previous IDS.
International Search Report (ISR) for PCT/JP2009/002843 (parent application) for Examiner consideration. Concise Explanation of Relevance: This ISR cites U.S. Patent Application Publication Nos. 1-3 and Foreign Patent Document Nos. 1-7 listed above as category A: “document defining the general state of the art which is not considered to be of particular relevance.”
Written Opinion (PCT/ISA/237) issued in PCT/JP2009/002843 (parent application). Concise Explanation of Relevance: This Written Opinion considers the claims are not described by or obvious over the references Nos. 1-7 cited in ISR.

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