Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-07-12
1998-09-01
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
G01R 3100
Patent
active
058015450
ABSTRACT:
An LCD assembly testing apparatus having a table for supporting the LCD assembly and for applying light to the back of the LCD assembly, and a transport mechanism for removing the LCD assembly from a cassette and transporting the LCD assembly onto the table. The transport mechanism has an arm for holding the LCD assembly, a first lift mechanism for vertical moving the arm, and a pre-alignment mechanism for receiving the LCD assembly and preliminary aligning the LCD assembly with the table. The pre-alignment mechanism has a plurality of support rollers for supporting the LCD assembly in a substantially horizontal position, four pairs of positioning rollers having axes intersecting at substantially right angles and located at level higher than the support rollers, for allowing the LCD assembly to fall naturally onto the support rollers and for holding corners of the LCD assembly, and a second lift mechanism for moving upwards the positioning rollers and the support rollers as the first lift mechanism moves the arm downwards.
REFERENCES:
patent: 4827212 (1989-05-01), Kamieniecki
patent: 5003254 (1991-03-01), Hunt et al.
patent: 5479108 (1995-12-01), Cheng
patent: 5506498 (1996-04-01), Anderson et al.
The Proceedings of the 1995 Japanese Spring Conference foe the Technology of Plasticity, (pp. 71-72), May 18-20, 1995.
Fujihara Hiromichi
Ono Tetsuji
Takekoshi Kiyoshi
Karlsen Ernest F.
Phung Anh
Tokyo Electron Limited
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