Techniques for three-dimensional circuit integration

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE31111, C438S455000

Reexamination Certificate

active

07955887

ABSTRACT:
Integrated circuits having complementary metal-oxide semiconductor (CMOS) and photonics circuitry and techniques for three-dimensional integration thereof are provided. In one aspect, a three-dimensional integrated circuit comprises a bottom device layer and a top device layer. The bottom device layer comprises a digital CMOS circuitry layer; and a first bonding oxide layer adjacent to the digital CMOS circuitry layer. The top device layer comprises a substrate; an analog CMOS and photonics circuitry layer formed in a silicon-on-insulator (SOI) layer adjacent to the substrate, the SOI layer having a buried oxide (BOX) with a thickness of greater than or equal to about one micrometer; and a second bonding oxide layer adjacent to a side of the analog CMOS and photonics circuitry layer opposite the substrate. The bottom device layer is bonded to the top device layer by an oxide-to-oxide bond between the first bonding oxide layer and the second bonding oxide layer.

REFERENCES:
patent: 5455193 (1995-10-01), Egloff
patent: 5514885 (1996-05-01), Myrick
patent: 5674758 (1997-10-01), McCarthy
patent: 6912759 (2005-07-01), Izadnegahdar et al.
patent: 6913941 (2005-07-01), O'Brien et al.
patent: 6927432 (2005-08-01), Holm et al.
patent: 6984571 (2006-01-01), Enquist
patent: 6984816 (2006-01-01), Holm et al.
patent: 7104130 (2006-09-01), Kenny et al.
patent: 7214999 (2007-05-01), Holm et al.
patent: 7253083 (2007-08-01), Clarke et al.
patent: 7425461 (2008-09-01), Mouli
patent: 7470598 (2008-12-01), Lee
patent: 7480425 (2009-01-01), Gunn et al.
patent: 2005/0095810 (2005-05-01), Nakata et al.
patent: 2005/0110159 (2005-05-01), Oh et al.
patent: 2006/0033110 (2006-02-01), Alam et al.
patent: 2006/0177173 (2006-08-01), Shastri et al.
patent: 2009/0272882 (2009-11-01), Rabner
patent: 2010/0059822 (2010-03-01), Pinguet et al.
J.M. Fedeli, “Heterogeneous Integration of III-V Sources and Detectors with Silicon Photonics Wires by Wafer-Scale CMOS-compatible Processes,” ECOC Conference (Nov. 2007).
Andry et al., “A CMOS-Compatible Process for Fabricating Electrical Through-Vias in Silicon,” 56th ECTC (2006).
Patel et al., “Silicon Carrier With Deep Through-Vias, Fine Pitch Wiring and Through Cavity for Parallel Optical Transceiver,” 55th ECTC (2005).
Knickerbocker et al., “Development of Next-Generation System-on-Package (SOP) Technology Based on Silicon Carriers With Fine-Pitch Chip Interconnection,” IBM J. Res. Develop., vol. 49 (2005).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Techniques for three-dimensional circuit integration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Techniques for three-dimensional circuit integration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Techniques for three-dimensional circuit integration will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2730942

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.