Differential waveguide probe

Details Differential waveguide probe Differential waveguide probe

2011-01-25

2011-01-25

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C333S248000

Reexamination Certificate

active

07876114

ABSTRACT:
A wafer probe comprises a contact conductively interconnected with the wall of a waveguide channel and supported by a substrate that projects from an end of a waveguide channel.

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