Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2011-03-08
2011-03-08
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
07903253
ABSTRACT:
A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.
REFERENCES:
patent: 5166749 (1992-11-01), Curbelo et al.
patent: 5265039 (1993-11-01), Curbelo et al.
patent: 5528368 (1996-06-01), Lewis et al.
patent: 5835214 (1998-11-01), Cabib et al.
patent: 5963322 (1999-10-01), Rapp et al.
patent: 6274871 (2001-08-01), Dukor et al.
patent: 6667808 (2003-12-01), Clermont et al.
patent: 7057733 (2006-06-01), Carter et al.
patent: 2001/0052979 (2001-12-01), Treado et al.
patent: 2002/0033452 (2002-03-01), Hoult et al.
Japanese Patent Abstract for Publication No. 05-223640 published Aug. 31, 1993, one page.
Chowdhury Tarifur
Hansen Jonathan M
Jasco Corporation
Rankin , Hill & Clark LLP
LandOfFree
Microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2721543