Microscope

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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Reexamination Certificate

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07903253

ABSTRACT:
A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.

REFERENCES:
patent: 5166749 (1992-11-01), Curbelo et al.
patent: 5265039 (1993-11-01), Curbelo et al.
patent: 5528368 (1996-06-01), Lewis et al.
patent: 5835214 (1998-11-01), Cabib et al.
patent: 5963322 (1999-10-01), Rapp et al.
patent: 6274871 (2001-08-01), Dukor et al.
patent: 6667808 (2003-12-01), Clermont et al.
patent: 7057733 (2006-06-01), Carter et al.
patent: 2001/0052979 (2001-12-01), Treado et al.
patent: 2002/0033452 (2002-03-01), Hoult et al.
Japanese Patent Abstract for Publication No. 05-223640 published Aug. 31, 1993, one page.

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