Contactless interfacing of test signals with a device under...

Details Contactless interfacing of test signals with a device under... Contactless interfacing of test signals with a device under...

2011-04-19

2011-04-19

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750300, C324S756050, C324S762010, C714S733000, C714S734000, C257S048000

Reexamination Certificate

active

07928750

ABSTRACT:
An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface device and the device under test. The device under test processes the test data and generates response data. A signal representing the response data is transmitted to the interface device through electromagnetically coupled structures on the device under test and the interface device.

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Chang et al., “RF/Wireless Interconnect for Inter- and Intra-Chip Communications,” Proceedings of the IEEE, vol. 89 No. 4 (Apr. 2001), pp. 456-466.

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