Word line defect detecting device and method thereof

Static information storage and retrieval – Addressing – Particular decoder or driver circuit

Reexamination Certificate

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Details

C365S189070

Reexamination Certificate

active

07965577

ABSTRACT:
Method for detecting word line defect includes activating a first word line for reading a first data pre-stored in the memory cell, suspending the first word line for a predetermined period and then writing a second data complementary to the first data into the memory cell, activating again the first word line for reading a third data from the memory cell, and comparing the second and the third data for determining if an electrical coupling path exists between the first word line and a second word line.

REFERENCES:
patent: 6023434 (2000-02-01), Shore et al.
patent: 7020039 (2006-03-01), Tran et al.
patent: 7366051 (2008-04-01), Ueda
patent: 7486587 (2009-02-01), Scheuerlein et al.

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