Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2011-08-30
2011-08-30
Nghiem, Michael P (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S079000, C702S082000, C702S089000, C702S107000
Reexamination Certificate
active
08010317
ABSTRACT:
A system and method is disclosed for providing a plurality of hardware performance monitors for adaptive voltage scaling in an integrated circuit system that comprises a plurality of threshold voltage VTlogic libraries. Each hardware performance monitor is associated with one of the plurality of threshold voltage VTlogic libraries and provides a signal that measures a performance of its respective threshold voltage VTlogic library die temperature, process corner and supply voltage. The difference between the measured performance and a nominal expected performance for each hardware performance monitor is determined. The largest of the plurality of difference signals is selected and provided to an advanced power controller for use in providing adaptive voltage scaling for the integrated circuit system.
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Pennanen Juna
Salmi Pasi
Desta Elias
National Semiconductor Corporation
Nghiem Michael P
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