Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-05-31
2011-05-31
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07952721
ABSTRACT:
A system includes a measuring tool, a fixture, and a rotatable target. The measuring tool includes a light source, an imaging device, and an electronic circuit. The fixture allows the rotatable target to rotate about an axis. The rotatable target includes a surface having microscopic asperities. The imaging device is mounted to provide a sequence of images derived from said microscopic asperities. The electronic circuit is connected to the imaging device for measuring rotation of the rotatable target from the sequence of images.
REFERENCES:
patent: 5596595 (1997-01-01), Tan
patent: 5686720 (1997-11-01), Tullis
patent: 5786804 (1998-07-01), Gordon
patent: 5818861 (1998-10-01), Tan
patent: 6151015 (2000-11-01), Badyal
patent: 6195475 (2001-02-01), Beausoleil, Jr.
patent: 6281882 (2001-08-01), Gordon
patent: 6289030 (2001-09-01), Charles
patent: 6433780 (2002-08-01), Gordon
patent: 6489945 (2002-12-01), Gordon
patent: 6600310 (2003-07-01), Nyce
patent: 6621483 (2003-09-01), Wallace
patent: 6704183 (2004-03-01), Stafford
patent: 7081693 (2006-07-01), Hamel
patent: 7256505 (2007-08-01), Arms
patent: 2002/0130835 (2002-09-01), Brosnan
patent: 2002/0158300 (2002-10-01), Gee
patent: 2002/0190953 (2002-12-01), Gordon
patent: 2003/0034959 (2003-02-01), Davis
patent: 2004/0084610 (2004-05-01), Leong
patent: 2004/0129095 (2004-07-01), Churchill
patent: 2004/0189593 (2004-09-01), Koay
patent: 2005/0024336 (2005-02-01), Xie
patent: 2005/0024623 (2005-02-01), Xie
patent: 2005/0083303 (2005-04-01), Schroeder
patent: 2007/0247636 (2007-10-01), Matsuoka
patent: 5196432 (1993-08-01), None
patent: 08122340 (1996-05-01), None
patent: 2007178137 (2007-07-01), None
No author, “ADNB-6011-EV and ADNB-6012-EV High Performance Laser Mouse Bundles,” data sheet, Jan. 19, 2007, pp. 1-52, Avago Technologies, San Jose, CA.
Arms Steven W.
Churchill David L.
Connolly Patrick J
Leas James Marc
MicroStrain, Inc.
LandOfFree
Optical linear and rotation displacement sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical linear and rotation displacement sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical linear and rotation displacement sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2701396