Thin-film patterning method for magnetoresistive device

Dynamic magnetic information storage or retrieval – Head – Magnetoresistive reproducing head

Reexamination Certificate

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C360S324200, C360S313000, C360S314000, C360S315000, C438S706000, C438S707000, C438S722000

Reexamination Certificate

active

07916432

ABSTRACT:
The thin-film patterning method for a magnetoresistive device comprises forming a functional layer on a substrate; forming a first mask layer above the functional layer; forming a patterned resist on the first mask layer; etching the first mask layer by using the resist; removing the resist; forming a second mask layer by atomic layer deposition, the second mask layer covering a step defined by an edge of the first mask layer; dry-etching the second mask layer in a thickness direction of the substrate so as to leave the second mask layer on a side face of the step; removing the first mask layer so as to expose the functional layer under the first mask; and dry-etching the functional layer by using the second mask layer.

REFERENCES:
patent: 6879470 (2005-04-01), Johnson et al.
patent: 6943409 (2005-09-01), Cheng et al.
patent: 7723807 (2010-05-01), Nishiyama
patent: A-05-342527 (1993-12-01), None
patent: A-2000-076618 (2000-03-01), None
patent: A-2001-110663 (2001-04-01), None
patent: A-2002-175606 (2002-06-01), None
patent: A-2003-017353 (2003-01-01), None
patent: WO 01/33558 (2001-05-01), None

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