Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material

Reexamination Certificate

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C257SE29309, C365S145000

Reexamination Certificate

active

07868320

ABSTRACT:
An object of the invention is to reduce an area occupied by a capacitor in a circuit in a semiconductor device, and to downsize a semiconductor device on which the capacitor and an organic memory are mounted. The organic memory and the capacitor, included in a peripheral circuit, in which the same material as the layer containing the organic compound used for the organic memory is used as a dielectric, are used. The peripheral circuit here means a circuit having at least a capacitor such as a resonance circuit, a power supply circuit, a boosting circuit, a DA converter, or a protective circuit. Further, a capacitor in which a semiconductor is used as a dielectric may be provided over the same substrate as well as the capacitor in which the same material as the layer containing the organic compound is used as a dielectric. In this case, it is desirable that the capacitor in which the same material as the layer containing the organic compound is used as a dielectric and the capacitor in which the semiconductor is used as a dielectric are connected to each other in parallel. (189)

REFERENCES:
patent: 3833894 (1974-09-01), Aviram et al.
patent: 4860254 (1989-08-01), Pott et al.
patent: 5349366 (1994-09-01), Yamazaki et al.
patent: 5375250 (1994-12-01), Van Den Heuvel
patent: 5497140 (1996-03-01), Tuttle
patent: 5883397 (1999-03-01), Isoda et al.
patent: 6013949 (2000-01-01), Tuttle
patent: 6045652 (2000-04-01), Tuttle et al.
patent: 6055180 (2000-04-01), Gudesen et al.
patent: 6133835 (2000-10-01), De Leeuw et al.
patent: 6229443 (2001-05-01), Roesner
patent: 6281552 (2001-08-01), Kawasaki et al.
patent: 6321067 (2001-11-01), Suga et al.
patent: 6331722 (2001-12-01), Yamazaki et al.
patent: 6340588 (2002-01-01), Nova et al.
patent: 6427065 (2002-07-01), Suga et al.
patent: 6525595 (2003-02-01), Oku
patent: 6528815 (2003-03-01), Brown et al.
patent: 6683322 (2004-01-01), Jackson et al.
patent: 6683802 (2004-01-01), Katoh
patent: 6741178 (2004-05-01), Tuttle
patent: 6809952 (2004-10-01), Masui
patent: 6847047 (2005-01-01), VanBuskirk et al.
patent: 6856630 (2005-02-01), Tanaka
patent: 6872969 (2005-03-01), Redecker
patent: 6894351 (2005-05-01), Okawa et al.
patent: 6950331 (2005-09-01), Yang et al.
patent: 6977389 (2005-12-01), Tripsas et al.
patent: 7050326 (2006-05-01), Anthony
patent: 7359230 (2008-04-01), Sumida et al.
patent: 7499305 (2009-03-01), Nomura et al.
patent: 2001/0026187 (2001-10-01), Oku
patent: 2003/0016133 (2003-01-01), Egbert
patent: 2003/0121985 (2003-07-01), Baldischweiler et al.
patent: 2003/0183699 (2003-10-01), Masui
patent: 2004/0026690 (2004-02-01), Bernds et al.
patent: 2004/0102176 (2004-05-01), Hayashi et al.
patent: 2004/0164302 (2004-08-01), Arai et al.
patent: 2004/0246099 (2004-12-01), Tuttle
patent: 2005/0079662 (2005-04-01), Miki
patent: 2005/0099839 (2005-05-01), Bhattacharyya
patent: 2005/0174875 (2005-08-01), Katoh
patent: 2006/0267068 (2006-11-01), Sato et al.
patent: 2007/0194301 (2007-08-01), Sezi et al.
patent: 2007/0230235 (2007-10-01), Abe et al.
patent: 2008/0048180 (2008-02-01), Abe et al.
patent: 1341186 (2003-09-01), None
patent: 1453088 (2004-09-01), None
patent: 07-022669 (1995-01-01), None
patent: 2775040 (1998-07-01), None
patent: 2000-299440 (2000-10-01), None
patent: 2001-345431 (2001-12-01), None
patent: 2004-509458 (2004-03-01), None
patent: WO-02/37500 (2002-05-01), None
patent: WO-2004/015778 (2004-02-01), None
patent: WO-2005/096380 (2005-10-01), None
patent: WO-2006/043611 (2006-04-01), None
patent: WO-2006/043687 (2006-04-01), None
Lemos, R., “RFID Tags Become Easy Target for Hacker,”, HTTP://JAPAN.CNET.COM/NEWS/SEC/STORY/02000050480,20070122,00.HTM, Jul. 29, 2007, pp. 1-3.

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