Plasma processing apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means

Reexamination Certificate

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Details

C118S7230MW

Reexamination Certificate

active

07897009

ABSTRACT:
A plasma processing apparatus (100) includes a plasma generation mechanism; a process container defining a process chamber configured to perform a plasma process on a target substrate; a substrate worktable configured to place the target substrate thereon inside the process container; and an exhaust mechanism configured to decrease pressure inside the process container. A wall (27a) of a support portion (27) for supporting a microwave transmission plate (28) is present in an area having an electron temperature of 1.5 eV or more during plasma generation. A covering portion (60) made of a heat resistant insulator, such as quartz, is disposed to cover the wall (27a).

REFERENCES:
patent: 6091045 (2000-07-01), Mabuchi et al.
patent: 2003/0217812 (2003-11-01), Yoshiki et al.
patent: 2004/0002221 (2004-01-01), O'Donnell et al.
patent: 2005/0037193 (2005-02-01), Sun et al.
patent: 2000 286237 (2000-10-01), None
patent: 2000 294550 (2000-10-01), None
patent: 2001 181042 (2001-07-01), None
patent: 2002 203839 (2002-07-01), None
patent: 2002 355550 (2002-12-01), None

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