Test apparatus, test method and computer readable medium

Details Test apparatus, test method and computer readable medium Test apparatus, test method and computer readable medium

2011-07-12

2011-07-12

Bhat, Aditya (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07979218

ABSTRACT:
Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that judges whether the device under test is defective or not, based on an output signal outputted from the device under test; a power supply apparatus that supplies a source power to the device under test; and a setting section that detects a fluctuation amount of the source voltage resulting when the test pattern is inputted to the device under test, and sets, based on the detected fluctuation amount, a current range within which a compensation current that is in accordance with a fluctuation of a consumption current consumed by the device under test is generated at a predetermined number of levels so as to compensate a fluctuation of a source voltage to be applied to the device under test attributable to the fluctuation of the consumption current.

REFERENCES:
patent: 2006/0072273 (2006-04-01), Hashimoto
patent: 2007/0091698 (2007-04-01), Watanabe et al.
patent: 7-218596 (1995-08-01), None
patent: 9-236637 (1997-09-01), None
patent: 2001-4692 (2001-01-01), None
patent: 2004104606 (2004-12-01), None
“Office Action of German Counterpart Application” issued on Mar. 12, 2010, p. 1-p. 10.

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