Methods and systems to characterize ST segment variation...

Surgery – Diagnostic testing – Cardiovascular

Reexamination Certificate

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Reexamination Certificate

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07949388

ABSTRACT:
A system and method are provided for characterizing ST segment (STS) variations of a patient. The method includes collecting STS variations for multiple data collection periods, calculating multiple statistical parameters based on the collected STS variations, and constructing a STS variation trend. The statistical parameters are associated with a corresponding data collection period. The STS variation trend is based on the multiple statistical parameters over multiple data collection periods.

REFERENCES:
patent: 4531527 (1985-07-01), Reinhold, Jr. et al.
patent: 4974162 (1990-11-01), Siegel et al.
patent: 4989610 (1991-02-01), Patton et al.
patent: 5113869 (1992-05-01), Nappholz et al.
patent: 5135004 (1992-08-01), Adams et al.
patent: 5199428 (1993-04-01), Obel et al.
patent: 5203326 (1993-04-01), Collins
patent: 5251621 (1993-10-01), Collins
patent: 5313953 (1994-05-01), Yomtov et al.
patent: 5388578 (1995-02-01), Yomtov et al.
patent: 5410473 (1995-04-01), Kaneko et al.
patent: 5497780 (1996-03-01), Zehender
patent: 5531768 (1996-07-01), Alferness
patent: 5891047 (1999-04-01), Lander et al.
patent: 6016443 (2000-01-01), Ekwall et al.
patent: 6021350 (2000-02-01), Mathson
patent: 6108577 (2000-08-01), Benser
patent: 6112116 (2000-08-01), Fischell et al.
patent: 6115628 (2000-09-01), Stadler et al.
patent: 6128526 (2000-10-01), Stadler et al.
patent: 6233486 (2001-05-01), Ekwall et al.
patent: 6256538 (2001-07-01), Ekwall
patent: 6264606 (2001-07-01), Ekwall et al.
patent: 6272379 (2001-08-01), Fischell et al.
patent: 6324421 (2001-11-01), Stadler et al.
patent: 6368284 (2002-04-01), Bardy
patent: 6381493 (2002-04-01), Stadler et al.
patent: 6468263 (2002-10-01), Fischell et al.
patent: 6501983 (2002-12-01), Natarajan et al.
patent: 6609023 (2003-08-01), Fischell et al.
patent: 6937899 (2005-08-01), Sheldon et al.
patent: 2002/0143262 (2002-10-01), Bardy
patent: 2002/0143263 (2002-10-01), Shusterman
patent: 2004/0260188 (2004-12-01), Syed et al.
patent: 2005/0059897 (2005-03-01), Snell et al.
patent: 2005/0113705 (2005-05-01), Fischell et al.
patent: 2005/0256417 (2005-11-01), Fischell et al.
patent: 2006/0009811 (2006-01-01), Sheldon et al.
patent: 2006/0116593 (2006-06-01), Zhang et al.
patent: 2006/0265020 (2006-11-01), Fischell et al.
patent: 2007/0208263 (2007-09-01), John et al.
patent: 0839544 (2003-07-01), None
patent: 1164933 (2006-05-01), None
patent: 0057781 (2000-10-01), None
patent: WO 03/020366 (2003-03-01), None
patent: WO 03/020367 (2003-03-01), None
patent: WO 2004/047917 (2004-06-01), None
NonFinal Office Action, mailed Nov. 20, 2009: Related U.S. Appl. No. 11/833,139.
NonFinal Office Action, mailed Jun. 24, 2009: Related U.S. Appl. No. 11/735,254.
Final Office Action, mailed Jun. 24, 2009: Related U.S. Appl. No. 11/735,254.
Final Office Action, mailed May 4, 2010: Related U.S. Appl. No. 11/833,139.
Advisory Action, mailed Jun. 28, 2010: Related U.S. Appl. No. 11/833,139.

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