Methods and apparatus for outlier detection for high...

Details Methods and apparatus for outlier detection for high... Methods and apparatus for outlier detection for high...

2011-01-04

2011-01-04

Starks, Jr., Wilbert L (Department: 2129)

Data processing: artificial intelligence

Knowledge processing system

Reexamination Certificate

active

07865456

ABSTRACT:
Methods and apparatus are provided for outlier detection in databases by determining sparse low dimensional projections. These sparse projections are used for the purpose of determining which points are outliers. The methodologies of the invention are very relevant in providing a novel definition of exceptions or outliers for the high dimensional domain of data.

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