Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-07-26
2011-07-26
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07986153
ABSTRACT:
An apparatus for sensing a change in capacitance of a sensing electrode to a system ground, such as that which may be used to form a touch sensor, with the sensing electrode forming touch sensitive surface is arranged to include a sleep mode of operation. The apparatus includes a sample capacitor having a first terminal coupled to the sensing electrode, and a second terminal coupled to a voltage measurement circuit. The voltage measurement circuit is arranged in operation to determine a voltage at the second terminal of the sample capacitor. A voltage biasing arrangement is arranged under the control of a controller to apply a biasing voltage or the system ground to the first terminal or the second terminal of the sample capacitor in accordance with a measurement cycle.
REFERENCES:
patent: 5730165 (1998-03-01), Philipp
patent: 5757196 (1998-05-01), Wetzel
patent: 6466036 (2002-10-01), Philipp
patent: 7088112 (2006-08-01), Yakabe
patent: 7107841 (2006-09-01), Mori
patent: 2004/0196617 (2004-10-01), Mori
patent: 2010/0045630 (2010-02-01), Gu et al.
Atmel Corporation
Baker & Botts L.L.P.
Hollington Jermele M
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