Method and apparatus for making coplanar isolated regions of...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having air-gap dielectric

Reexamination Certificate

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C257S276000, C257S522000, C257SE21564, C257SE21573, C257SE23013, C438S319000, C438S411000, C438S421000, C438S619000

Reexamination Certificate

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07947566

ABSTRACT:
A semiconductor processing method includes providing a substrate, forming a plurality of semiconductor layers in the substrate, each of the semiconductor layers being distinct and selected from different groups of semiconductor element types. The semiconductor layers include a first, second, and third semiconductor layers. The method further includes forming a plurality of lateral void gap isolation regions for isolating portions of each of the semiconductor layers from portions of the other semiconductor layers.

REFERENCES:
patent: 4169000 (1979-09-01), Riseman
patent: 5306659 (1994-04-01), Beyer et al.
patent: 6861729 (2005-03-01), Kozaki et al.
patent: 7015147 (2006-03-01), Lee et al.
patent: 7335599 (2008-02-01), Chen et al.
patent: 2002/0045325 (2002-04-01), Kuhn et al.
patent: 2002/0126725 (2002-09-01), Tayebati

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