Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2011-07-19
2011-07-19
Patel, Ramesh B (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S099000, C700S100000
Reexamination Certificate
active
07983778
ABSTRACT:
A method includes determining production targets for devices of different types in a production line. A queue level of devices of a first type that have completed performance of a first operation configured in accordance with a first setup state in the production line and await performance of a second operation in the production line is determined. Based on the determined queue level, a second type of device is selected for subsequent processing in the first operation based on the production targets and a setup time associated with configuring the first operation from the first setup state to a second setup state associated with the second type of device. The first operation is configured in accordance with the second setup state for processing devices of the second type.
REFERENCES:
patent: 5444632 (1995-08-01), Kline et al.
patent: 5446671 (1995-08-01), Weaver et al.
patent: 2005/0071031 (2005-03-01), Lin et al.
Vieira et al. “Predicting the Performance of Rescheduling Strategies for Parallel Machine Systems” Journal of Manufacturing Systems vol. 19 No. 4. pp. 256-266, 2000.
Advanced Micro Devices , Inc.
Garland Steven R
Patel Ramesh B
Williams Morgan & Amerson P.C.
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