Microcontactor probe with reduced number of sliding contacts...

Details Microcontactor probe with reduced number of sliding contacts... Microcontactor probe with reduced number of sliding contacts...

2011-06-28

2011-06-28

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754030, C324S754120, C324S754140

Reexamination Certificate

active

07969170

ABSTRACT:
In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

REFERENCES:
patent: 4724383 (1988-02-01), Hart
patent: 5014004 (1991-05-01), Kreibich et al.
patent: 5990697 (1999-11-01), Kazama
patent: 7057403 (2006-06-01), Kazama
patent: 04-270967 (1992-09-01), None

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