Testing apparatus and testing method

Details Testing apparatus and testing method Testing apparatus and testing method

2011-06-14

2011-06-14

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07960995

ABSTRACT:
Provided is a test apparatus that tests a device under test that outputs a plurality of modulated signals modulated with carrier signals having frequencies identical to each other, including a synthesizing section that synthesizes the plurality of modulated signals to output a synthesized signal; an AD converting section that samples the synthesized signal to output a digital signal corresponding to the synthesized signal; and a judging section that judges acceptability of the plurality of modulated signals output by the device under test, based on the digital signal.

REFERENCES:
patent: 5835213 (1998-11-01), Curbelo
patent: 6023203 (2000-02-01), Parish
patent: 6993069 (2006-01-01), Donati et al.
patent: 7433660 (2008-10-01), Rooyen et al.
patent: 2004/0208251 (2004-10-01), Learned et al.
patent: 2005/0239506 (2005-10-01), Li
patent: 2005/0240852 (2005-10-01), Inaba et al.
patent: 2006/0050805 (2006-03-01), Chen et al.
patent: 2008/0084951 (2008-04-01), Chen et al.
patent: 2011/0054827 (2011-03-01), Ishida et al.
patent: 1643636 (2006-04-01), None
patent: 08-184645 (1996-07-01), None
patent: 10-096750 (1998-04-01), None
patent: 10-164149 (1998-06-01), None
patent: 11-044723 (1999-02-01), None
patent: 2001-251219 (2001-09-01), None
patent: 2002-300224 (2002-10-01), None
patent: 2006-317369 (2006-11-01), None
“Office Action of Germany Counterpart Application”, issued on Aug. 27, 2010, p. 1-p. 7, in which the listed references were cited.
Particial translation of above-listed Office Action of Germany Counterpart Application of Aug. 27, 2010, p. 1-p. 11.

Affiliated with

Also associated with

Rating

Testing apparatus and testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing apparatus and testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing apparatus and testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2662404